The Surfscan 6200 (SFS6200) wafer surface defects analysis system. Condition: refurbished, operational, calibrated and tested. Ready for delivery, crated. Installation and training services are available. Please contact us if interested at www.semiphoton.com Thank you! Specifications: • Substrate Sizes: 50mm(2"), 76mm(3"), 100mm(4"), 125mm(5"), 150mm(6"), 200mm(8") wafers • Substrate Material:...